Title :
A 1.8V low noise threshold voltage reference generator with temperature and process calibration
Author :
Tingting Tao ; Chaojie Fan ; Dongpo Chen ; Jianjun Zhou
Author_Institution :
Center for Analog/RF Integrated Circuits (CARFIC), Shanghai Jiao Tong Univ., Shanghai, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
The bandgap voltage reference is ideally independent of the power supply and the temperature drift. However, the low frequency output noise of the circuit is large due to noise contribution from the current mirrors and this is the problem in noise-sensitive applications. In this paper, a 1.8V low noise threshold voltage reference generator is proposed to generate a fairly precise reference voltage with a very low noise. A 5-bit digital calibration loop is utilized to overcome the effects of the temperature drift and process variations. Designed and simulated in a 65 nm CMOS process, the proposed threshold voltage reference generator has an output noise of 13.1nV/sqrt(Hz) at 100 KHz at 35°C, far better than traditional bandgap reference circuit. The output voltage inaccuracy is ±2.4% when the supply voltage deviates from 2.5V to 3.5V, the temperature varies from -35°C to 95°C, and over all of the process variation corners.
Keywords :
CMOS integrated circuits; calibration; circuit noise; current mirrors; reference circuits; CMOS process; bandgap voltage reference; current mirror; low frequency output noise; low noise threshold voltage reference generator; noise contribution; noise sensitive applications; process calibration; process variation; reference voltage; size 65 nm; temperature -35 C to 95 C; temperature calibration; voltage 1.8 V; voltage 2.5 V to 3.5 V; Calibration; Generators; Noise; Photonic band gap; Power supplies; Threshold voltage; Voltage control;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467718