DocumentCode :
3418046
Title :
Evaluation of Falling Time Restriction of ESD Immunity Test Current Waveform: The Result of IEC 61000-4-2 Round Robin Test in Japan
Author :
Hirata, Masayuki ; Takahashi, Takehiro ; Schibuya, Noboru
Author_Institution :
Fuji Xerox, Ebina
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
4
Abstract :
This paper describes the results of the round robin test for IEC 61000-4-2 ESD immunity test which was held in Japan. In order to reduce the variation of the test results of the ESD test depending on the ESD generator, the additional restriction for ESD current waveform was proposed and considered in IEC SC77B/MT12. The effect of the restriction was evaluated by round robin test at three countries; Japan, U.S.A and Germany. The test results show that the restriction is effective to reduce the variation, however, the much severe restriction is needed to reduce the dependency of the ESD generator.
Keywords :
IEC standards; electrostatic discharge; immunity testing; ESD generator; ESD immunity test current waveform; IEC 61000-4-2 round robin test; IEC SC77B/MT12; electrostatic discharge; falling time restriction; AC generators; Delay effects; Electrostatic discharge; Grounding; IEC standards; Performance evaluation; Printers; Round robin; Testing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.171
Filename :
4305751
Link To Document :
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