Title :
Yield and productivity management
Author :
Effron, Melvyn S.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
fDate :
30 Sep-1 Oct 1992
Abstract :
Summary form only given. The approaches, attitudes, and methodologies used by over 20 semiconductor manufacturers to manage yield and improve productivity have been examined. Selected topics in management systems and measurements, long- and short-loop analysis, data and information generation and handling, and manufacturing operational procedures have been considered
Keywords :
management; semiconductor device manufacture; information generation; long-loop analysis; management systems; operational procedures; productivity; semiconductor manufacturers; short-loop analysis; yield; Computer integrated manufacturing; Conference management; Databases; Engineering management; Environmental management; Information analysis; Pareto analysis; Productivity; Quality management; Semiconductor device manufacture;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-0740-2
DOI :
10.1109/ASMC.1992.253808
