DocumentCode :
3418351
Title :
Practical pressure measurement using MEMS
Author :
Jones, Roger
fYear :
2005
fDate :
38467
Abstract :
Early pressure measuring equipment relied on a mechanism to translate the deflection of a structure into the motion of a pointer against a dial. Examples of this are the aneroid barometer and the Bourdon tube pressure gauge. However, with the move towards automated monitoring and control the requirement arose for pressure transducers with an electrical output. Initially this requirement was satisfied by the addition of an electrical position transducer to the mechanical structure, resulting in a complex and expensive assembly. Silicon MEMS is an ideal technology for pressure measurement because the same silicon element performs the two functions of a linear, repeatable mechanical structure and also an electronic strain gauge transducer. Combined with the low production cost afforded by wafer scale manufacture silicon MEMS has developed over the last 30 years to be the technology of choice for pressure measurement.
Keywords :
elemental semiconductors; microsensors; pressure measurement; pressure transducers; silicon; strain gauges; Bourdon tube pressure gauge; aneroid barometer; automated control; automated monitoring; electrical output; electrical position transducer; electronic strain gauge transducer; linear repeatable mechanical structure; pressure measurement; pressure measuring equipment; pressure transducers; silicon MEMS; structure deflection;
fLanguage :
English
Publisher :
iet
Conference_Titel :
MEMS Sensor Technologies, 2005. The IEE Seminar and Exhibition on
ISSN :
0537-9989
Print_ISBN :
0-86341-523-7
Type :
conf
DOI :
10.1049/ic:20050110
Filename :
1453354
Link To Document :
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