DocumentCode :
3418393
Title :
High-speed photo-modulated spindt cathode for FELs
Author :
Holland, Christopher ; Schwoebel, Paul ; Todd, K. ; Spindt, Capp ; Smith, Tim
Author_Institution :
SRI Int., Menlo Park, CA, USA
fYear :
2013
fDate :
8-12 July 2013
Firstpage :
1
Lastpage :
2
Abstract :
SRI International is integrating a Spindt-type field-emission source with a high-mobility GaN photoconducting semiconductor switch (PCSS) to develop cathodes capable of producing Ampere-level currents in the picosecond pulse regime. Semi-insulating Fe-doped GaN was selected for this application because of its high breakdown voltage, low resistance, and high carrier mobility. Both thin-film and bulk GaN are being investigated. Measurements of GaN carrier lifetime have shown that switch response times of 3-50 ps should be possible. Initial PCSS measurements with a moderate power femtosecond laser operating between 400-530 nm are limited by instrumentation but have shown sub-100 ps switch rise times. Subnanosecond field-emission current modulation has also been measured. A radiofrequency (RF) cavity based streak camera is being developed to measure the electron beam´s pulse width.
Keywords :
III-V semiconductors; carrier mobility; electric breakdown; field emission; free electron lasers; gallium compounds; photocathodes; photoconducting switches; semiconductor doping; wide band gap semiconductors; Ampere-level currents; FELs; Fe; GaN; GaN carrier lifetime measurements; PCSS; RF cavity; SRI International; breakdown voltage; bulk GaN; carrier mobility; cathodes; electron beam pulse width measurement; free-electron laser; high-speed photo-modulated spindt cathode; photoconducting semiconductor switch; picosecond pulse regime; power femtosecond laser; radiofrequency cavity; semiinsulating Fe-doped GaN; spindt-type field-emission source; streak camera; subnanosecond field-emission current modulation; thin-film GaN; time 3 ps to 50 ps; Cathodes; Gallium nitride; Measurement by laser beam; Optical switches; Resistance; Semiconductor device measurement; Field-emission cathode; GaN; Spindt cathode; free-electron laser; photoconducting semiconductor switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
Conference_Location :
Roanoke, VA
Type :
conf
DOI :
10.1109/IVNC.2013.6624710
Filename :
6624710
Link To Document :
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