DocumentCode :
3418459
Title :
Progress with developing theory for fowler-nordheim plot interpretation
Author :
Forbes, Richard G. ; Deane, Jonathan H. B.
Author_Institution :
Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
fYear :
2013
fDate :
8-12 July 2013
Firstpage :
1
Lastpage :
3
Abstract :
The work described in this conference talk follows up recent work on the development of a test for lack of field emission orthodoxy. There are three stages of discussion involved. First, the results of applying the test to 17 selected published FN plots are reported. About half fail the test, showing that related published field enhancement factor (FEF) values are unreliable. In several cases, this failure is probably related to plot “saturation” associated with series resistance. Thus, second, we have explored how to calculate a “slope correction factor for the case of constant series resistance”. This can be done, but the outcome is not useful. Third, we briefly outline other conceivable routes to more accurate extraction or characterization of “true physical FEFs”, and suggest that systematic simulation experiments on all or some of these might be of interest.
Keywords :
electric resistance; electron field emission; FEF values; FN plots; Fowler-Nordheim plot interpretation; constant series resistance; field electron emission; field emission orthodoxy; field enhancement factor; plot saturation; slope correction factor; Current measurement; Electrical resistance measurement; Equations; Materials; Mathematical model; Resistance; Voltage measurement; Field electron emission; Fowler-Nordheim plots; field emission orthodoxy test; saturation; series resistance; slope correction factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
Conference_Location :
Roanoke, VA
Type :
conf
DOI :
10.1109/IVNC.2013.6624714
Filename :
6624714
Link To Document :
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