Title :
Properties of oxygen vacancy in W-doped monoclinic HfO2 based on the first principle calculations
Author :
Long Ma ; Zi-Qing Lu ; Bin Gao ; Bin Chen ; Peng Huang ; Li-Feng Liu ; Xiao-yan Liu ; Jin-Feng Kang
Author_Institution :
Shenzhen Grad. Sch., Peking Univ., Shenzhen, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
In this paper, density functional theory (DFT) calculations of formation energy and relaxed structure were performed in W-doped HfO2 system, and electrical levels of oxygen vacancy and vacancy chain were also compared in monoclinic HfO2. The simulation shows that the formation energy of threefold and fourfold oxygen vacancy in the vicinity of W atom is lower compared to dopant-free monoclinic HfO2. However, the formation energy of oxygen vacancy far from dopant keeps the same. The dopant W atom makes the oxygen vacancy states shifted downward, and at the same time, the shallow level of 5d states may cause the electrons more easily to be thermally activated to be free conduction carriers.
Keywords :
density functional theory; dielectric materials; doping; hafnium compounds; tungsten; vacancies (crystal); DFT calculation; W-doped monoclinic HfO2; conduction carrier; density functional theory; electrical level; first principle calculation; formation energy; oxygen vacancy; vacancy chain; Density functional theory; Discrete Fourier transforms; Doping; Educational institutions; Energy states; Hafnium compounds; Semiconductor process modeling;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467752