Title :
Common centroid differential pair signal pin-to-signal pin analog ESD design
Author_Institution :
Dr. Steven H. Voldman LLC, South Burlington, VT, USA
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
Novel common centroid concepts for analog circuit differential pair ESD protection for both signal pin-to-rail, as well differential pair pin-to-pin protection concepts for small area, capacitance reduction, and mismatch avoidance are demonstrated for the first time.
Keywords :
analogue integrated circuits; capacitance; electrostatic discharge; integrated circuit design; radiofrequency integrated circuits; analog circuit differential pair ESD protection; capacitance reduction; common centroid differential pair signal pin-to-signal pin analog ESD design; differential pair pin-to-pin protection concepts; mismatch avoidance; Arrays; Capacitance; Electrostatic discharges; Fingers; Loading; Pins; Standards;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467757
