Title :
Built-in self-test in mixed-signal ICs: a DTMF macrocell
Author :
Huertas, Gloria ; Vazquez, Diego ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
Inst. de Microelectron., Seville Univ., Spain
Abstract :
This paper describes a Design-for-Test (DfT) approach to implement a DTMF embeddable macrocell. The goal is to prove the feasibility of a Built-In-Self-Test (BIST) methodology to mixed-signal ICs. Results from a silicon demonstrator are presented
Keywords :
VLSI; built-in self test; design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; ASIC; BIST methodology; DFT approach; DTMF macrocell; DTMF receiver; built-in self-test; design-for-test approach; mixed-signal ICs; Built-in self-test; Circuit testing; Electronic design automation and methodology; Feedback loop; Filter bank; Frequency; Macrocell networks; Multiplexing; Oscillators; Switches;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812668
