Title :
Field emission from surface textured extraction facets of GaN light emitting diodes
Author :
Schreiner, Rupert ; Langer, Christoph ; Prommesberger, Christian ; Mingels, S. ; Serbun, P. ; Muller, Gunter
Author_Institution :
Fac. of Microsyst. Technol., Regensburg Univ. of Appl. Sci., Regensburg, Germany
Abstract :
We report on the field emission properties of GaN LED surfaces. The textured extraction facet acts both as light scattering layer in order to increase the light extraction efficiency of the LED as well as nanostructured cathode surface for the field emission (FE) of electrons. The LED emits blue light with a peak wavelength of around 450 nm. The FE properties were investigated by a scanning microscope. Integral measurements as well as regulated voltage scans for 1 nA FE current over an area of 400 × 400 μm2 were used to investigate both overall and local FE properties. A high number of well-distributed emitters with an average field enhancement factor β of 85 and stable integral emission currents up to 100 μA at an electric field of ~ 80 V/μm (Øanode = 880 μm) were found. Photo-field-emission spectroscopy (PFES) using a tunable pulsed laser revealed an enhanced photo absorption of the InGaN/GaN quantum well structures near the emission wavelength of the LED (<;3.5 eV), whereas at high photon energies (>4.1 eV) photoemission from the GaN surface was observed.
Keywords :
III-V semiconductors; cathodes; electron field emission; gallium compounds; indium compounds; light emitting diodes; light scattering; nanoelectronics; nanostructured materials; photoelectron microscopy; photoemission; photoexcitation; quantum well lasers; surface texture; vacuum microelectronics; wide band gap semiconductors; FE properties; GaN; InGaN-GaN; LED surfaces; PFES; blue light emission; current 1 nA; electric field; emission wavelength; field emission properties; integral measurements; light emitting diodes; light extraction efficiency; light scattering layer; nanostructured cathode surface; peak wavelength; photo-field-emission spectroscopy; photoabsorption; photoemission; photon energies; quantum well structures; regulated voltage scans; scanning microscope; stable integral emission; surface textured extraction; tunable pulsed laser; Cathodes; Gallium nitride; Iron; Light emitting diodes; Photonics; Surface texture; Surface waves; GaN; field emission cathode; photo-field-emission;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
Conference_Location :
Roanoke, VA
DOI :
10.1109/IVNC.2013.6624721