DocumentCode :
3418674
Title :
Non-crystallization and enhancement of field emission of cupric oxide nanowires induced by low-energy Ar Ion bombardment
Author :
Xiaomeng Song ; Jun Chen
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
fYear :
2013
fDate :
8-12 July 2013
Firstpage :
1
Lastpage :
2
Abstract :
The effect of Ar ion bombardment on field emission properties of CuO nanowires was investigated. A Kauffmann ion source was used to produce the Ar ion and bombard the CuO nanowires at the energy of 115, 215, and 415 eV. Non-crystallization and improvement of field emission properties of cupric oxide nanowires were observed. Lowest threshold field was obtained from nanowires after 215 eV Ar ion bombardment. The increase of field enhancement factor and decrease of work function may contribute to the enhanced field emission.
Keywords :
argon; copper compounds; crystallisation; field emission; ion beam effects; nanowires; Ar; CuO; CuO nanowires; Kauffmann ion source; electron volt energy 115 eV; electron volt energy 215 eV; electron volt energy 415 eV; field emission enhancement; field emission properties; field enhancement factor; ion bombardment; noncrystallization; threshold field; work function; Heating; CuO nanowires; Field emission; ion bombardment; non-crystallization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
Conference_Location :
Roanoke, VA
Type :
conf
DOI :
10.1109/IVNC.2013.6624724
Filename :
6624724
Link To Document :
بازگشت