DocumentCode :
3418709
Title :
High-Accuracy Emission Simulation Models for VLSI Chips including Package and Printed Circuit Board
Author :
Steinecke, Thomas ; Goekcen, Mehmet ; Hesidenz, Dirk ; Gstoettner, Andreas
Author_Institution :
Infineon Technol. AG, Neubiberg
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
6
Abstract :
The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. The design of any emission test board influences the emission finally measured at defined probing connectors. Good simulation models have to serve two main interests: (1) identification of emission-related IC design weaknesses and estimation of measured emission from the IC manufacturer´s point of view and (2) identification of emission- related application board design weaknesses and estimation of measured emission from the system manufacturer´s point of view. This paper presents a target-leading approach for a full system emission simulation model which serves both the IC and system manufacturer´s interests. The simulation model has been created and verified for a 32-bit automotive microcontroller containing 30 million transistors.
Keywords :
VLSI; electromagnetic fields; electromagnetic interference; integrated circuit packaging; microcontrollers; printed circuits; 32-bit automotive microcontroller; VLSI chips; electromagnetic emission simulation models; package; printed circuit board; very large scale integrated circuits; Application specific integrated circuits; Circuit simulation; Electromagnetic interference; Electromagnetic propagation; Integrated circuit modeling; Integrated circuit noise; Integrated circuit packaging; Printed circuits; Very large scale integration; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.207
Filename :
4305787
Link To Document :
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