DocumentCode :
3419070
Title :
Novel technological solution to improve both Q factor and losses of passive circuits on low resistivity silicon
Author :
Grenier, K. ; Bouchriha, F. ; Dubuc, David ; Pons, P. ; Graffeuil, J. ; Plana, R.
Author_Institution :
Lab. d´Autom. et d´Anal. des Syst., CNRS, Toulouse, France
fYear :
2003
fDate :
11-11 April 2003
Firstpage :
115
Lastpage :
117
Abstract :
This paper deals with a novel technological solution based on the use of surface micromachining in coplanar slots that are filled with a thick organic dielectric layer. This technique enables both Q factor and losses improvements of passive circuits realized on low resistivity silicon substrate. It permits indeed to achieve much better attenuation level without an important decrease of the effective permittivity.
Keywords :
Q-factor; coplanar waveguides; losses; micromachining; passive networks; permittivity; CPW line; Q-factor; Si; attenuation coefficient; coplanar slot; effective permittivity; loss; low-resistivity silicon substrate; organic dielectric layer; passive circuit; surface micromachining technology; Attenuation; Conductivity; Coplanar waveguides; Dielectric losses; Etching; Micromachining; Passive circuits; Polymers; Q factor; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2003. Digest of Papers. 2003 Topical Meeting on
Conference_Location :
Grainau, Germany
Print_ISBN :
0-7803-7787-7
Type :
conf
DOI :
10.1109/SMIC.2003.1196683
Filename :
1196683
Link To Document :
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