• DocumentCode
    3419144
  • Title

    Analysis of solder bump position affecting stress performance by the finite element method

  • Author

    Ruangsinchaiwanich, S. ; Nakem, P. ; Intachai, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Naresuan Univ., Phitsanuloke
  • fYear
    2008
  • fDate
    3-5 Sept. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Due to the smaller size of HDD, fault deformation of solder bumps is found more often. In order to study about a factor relating to fault deformation of solder bumps, the FEM is used to investigate stress performance. The results show that a small number of bumps positioned in a symmetric form have similar stress while a small number of bumps positioned in the asymmetric form have different stress. The results also show that a large number of bumps positioned in the symmetric form also have different stress. Bumps positioned at the corner have highest stress while bumps positioned at the center have lowest stress. The FEM and analytical method are found to be suitable for this study.
  • Keywords
    deformation; failure analysis; finite element analysis; integrated circuit manufacture; integrated circuit packaging; soldering; stress analysis; FEM; HDD; fault deformation; finite element method; integrated circuit packaging; solder bump position stress performance; Capacitive sensors; Creep; Finite element methods; Packaging; Performance analysis; Propulsion; Shape; Stress; Thermal conductivity; Vehicles; Analytical Method; Finite Element Method; Positioning Effect; Solder Bump; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicle Power and Propulsion Conference, 2008. VPPC '08. IEEE
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-1848-0
  • Electronic_ISBN
    978-1-4244-1849-7
  • Type

    conf

  • DOI
    10.1109/VPPC.2008.4677529
  • Filename
    4677529