• DocumentCode
    3419301
  • Title

    Common Mode Voltage Evaluation for choosing Quiet MCU and Optimizing PCB Design: Electromagnetic Emissions Measurement for Integrated Circuits

  • Author

    Nakamura, Atsushi ; Mabuchi, Yuichi

  • Author_Institution
    Renesas Technol. Corp., Tokyo
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Similar to the fact that the differential signaling interfaces radiate less amount than the typical single ended interfaces, radiation from wire harness connected to electronic control units using single chip micro computers can be reduced by adjusting the common mode voltage fluctuation of supply lines. The radiation from wire harness can be minimized when the Vcc and the Vss fluctuate with same magnitude in opposite phase. As estimating these fluctuations of real products using lots of components on complex PCB layout by simulation technique is quite difficult at this moment, alternative solution to investigate the common mode voltage fluctuation has been investigated. By the Workbench Faraday cage method and advanced usage of it with 180 deg four ports hybrid balun, common mode voltage fluctuations of Vcc and Vss with phase information can be monitored. Examples of this measured data are discussed and a way of reducing common mode radiation from wire harness is explained.
  • Keywords
    microcomputers; printed circuit layout; MCU; PCB layout; Workbench Faraday cage method; common mode voltage evaluation; differential signaling interfaces; hybrid balun; micro computers; optimizing PCB design; phase information; supply lines; wire harness; Design optimization; Electromagnetic measurements; Electromagnetic radiation; Integrated circuit measurements; Microcomputers; Semiconductor device measurement; Variable structure systems; Voltage control; Voltage fluctuations; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1349-4
  • Electronic_ISBN
    1-4244-1350-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2007.238
  • Filename
    4305818