DocumentCode :
3419318
Title :
Circuit design challenges and trends in read sensing schemes for resistive-type emerging nonvolatile memory
Author :
Meng-Fan Chang ; Ku-Feng Lin ; Ching-Hao Chuang ; Li-Yue Huang ; Tun-Fei Chien ; Shyh-Shyuan Sheu ; Keng-Li Su ; Heng-Yuan Lee ; Chen, F.T. ; Chen-Hsin Lien ; Ping-Cheng Chen ; Lih-Yih Chiou ; Tzu-Kun Ku ; Ming-Jinn Tsai ; Ming-Jer Kao
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
1
Lastpage :
4
Abstract :
Nonvolatile memory has become a bottleneck in attempts to reduce the energy consumption of electronic systems. Several emerging forms of nonvolatile memory have shown promise in overcoming these difficulties, achieving faster write speeds and lower power operations than those afforded by Flash memories. Unfortunately, constraints related to bitline bias-voltage, small read cell current, and process variation detract considerably from the efficiency of read operations. This paper provides a review of the challenges and trends associated with the read sensing circuitry used in emerging nonvolatile memories.
Keywords :
flash memories; network synthesis; power consumption; random-access storage; bitline bias-voltage; circuit design challenges; circuit design trends; electronic systems; energy consumption; flash memories; lower power operations; process variation detraction; read sensing circuitry; resistive-type emerging nonvolatile memory; small read cell current; write speeds; Market research; Nonvolatile memory; Power demand; Random access memory; Sensors; Switches; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
Type :
conf
DOI :
10.1109/ICSICT.2012.6467794
Filename :
6467794
Link To Document :
بازگشت