The topografiner with energy analysis

Author

Zanin, D.A. ; Erbudak, M. ; De Pietro, L.G. ; Cabrera, H. ; Redmann, A. ; Fognini, A. ; Michlmayr, T. ; Acremann, Y.M. ; Pescia, D. ; Ramsperger, U.

Author_Institution

Lab. for Solid State Phys., ETH Zurich, Zurich, Switzerland

fYear

2013

fDate

8-12 July 2013

Firstpage

1

Lastpage

2

Abstract

The topografiner technology, developed originally at the National Bureau of Standards (now National Institute of Standards and Technology) with the aim of measuring the surface micro-topography, is less widespread than scanning tunneling microscopy but has a remarkable property: the electrons can escape the tip-surface junction. We have recently used topografiner imaging to map the surface of various metals and semiconductors with (almost) nanometer lateral spatial resolution. In this paper, we describe our attempt to endowing the NIST topografiner with an energy analysis of the electrons escaping the junction, with the aim of performing spectroscopy with nanometer spatial resolution.

Keywords

electron field emission; scanning tunnelling microscopy; surface topography; NIST topografiner; energy analysis; field emission; nanometer lateral spatial resolution; nanometer spatial resolution; scanning tunneling microscopy; surface microtopography; tip-surface junction; topografiner imaging; topografiner technology; Electron beams; Junctions; Scanning electron microscopy; Spatial resolution; Surface topography; Energy-loss spectroscopy; Field-Emission; Topografiner;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference (IVNC), 2013 26th International

Conference_Location

Roanoke, VA

Type

conf

DOI

10.1109/IVNC.2013.6624755

Filename

6624755