A heuristic for wiring-aware built-in self-test synthesis

This paper addresses the problem of BIST synthesis that takes into account wiring area. A technique for minimizing BIST hardware overhead is presented. The technique uses results of symbolic testability analysis to guarantee testability of all modules in the design. New behavioral-level BIST enhancement metrics are used to guide synthesis in such a way that the number of testability enhancements is minimized. The technique is not only fast but also adds low BIST overhead.