• DocumentCode
    3419553
  • Title

    The effect of barrier form on slope and intercept correction factors for curved emitters: Development of some enabling theory

  • Author

    Fischer, Anath ; Mousa, Marwan S. ; Deane, Jonathan H. B. ; Forbes, Richard G.

  • Author_Institution
    Inst. fur Phys., Tech. Univ. Chemnitz, Chemnitz, Germany
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The work described in this conference poster follows up recent work on the interpretation of Fowler-Nordheim (FN) plots. It puts in place some enabling theory that should allow further development of plot interpretation theory, in the context of the sphere-on-orthogonal-cone (SOC) emitter model. This model is expected to be more suitable, for small-apex-radius emitters, than the spherical-emitter (SPH) model. First, this report shows (as expected) that use of the spherical image-potential-energy formula, rather than the planar formula, appears to make little difference to the values of calculated parameters. Second, values of the exponent n (in the SOC model) are tabulated as a function of internal cone half-angle. Third, an expression is derived for the electrostatic component of electron motive energy, in the SOC model. Finally, the results of a sample calculation are presented. This compares values of the slope correction factor σ for the SPH and SOC models, for emitter-radius values 20 nm and 5 nm. As expected, the results for the two models are similar for 20 nm, but diverge as apex radius decreases.
  • Keywords
    electron field emission; electrostatics; Fowler-Nordheim plots; barrier form effect; curved emitters; electron motive energy; electrostatic component; intercept correction factor; planar formula; plot interpretation theory; slope correction factor; small apex radius emitters; sphere on orthogonal cone emitter model; spherical emitter model; spherical image potential energy formula; Context; Educational institutions; Electric potential; Electron emission; Electrostatic measurements; Electrostatics; System-on-chip; Field electron emission; Fowler-Nordheim plot; slope correction factor; sphere-on-orthogonal-cone emitter model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2013 26th International
  • Conference_Location
    Roanoke, VA
  • Type

    conf

  • DOI
    10.1109/IVNC.2013.6624760
  • Filename
    6624760