Title :
A high sensitivity z-axis torsional silicon accelerometer
Author :
Selvakumar, A. ; Ayazi, F. ; Najafi, K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
This paper presents a high sensitivity silicon micromachined capacitive accelerometer fabricated using a three mask, dissolved wafer process. High electrical sensitivity is obtained by using high aspect-ratio comb fingers with narrow air gaps of 2 /spl mu/m and large overlap area of 12 /spl mu/m/spl times/300 /spl mu/m. Torsional suspension beams 150 /spl mu/m long with a cross-sectional area of 12 /spl mu/m/spl times/3 /spl mu/m are used to improve the mechanical gain (form factor). By using a varying overlap area method, the dynamic range, the pull-in voltage and the bandwidth are improved. The fabricated accelerometers yielded sensitivities of 263-300 mV/g, a nonlinearity less than 0.2% over a range of -4 g to +3 g, a full scale range of -4 g to +6 g and pull-in voltages greater than 8 V. A 3-dB cut-off frequency of 30 Hz was measured in air. The minimum resolution measured by the readout electronics was 0.077 g.
Keywords :
accelerometers; capacitance measurement; elemental semiconductors; micromachining; microsensors; semiconductor technology; silicon; torsion; 150 mum; 2 mum; 3-dB cut-off frequency; 30 Hz; 8 V; Si; bandwidth improvement; cross-sectional area; dynamic range; form factor; high aspect-ratio comb fingers; high electrical sensitivity; high sensitivity Si micromachined capacitive accelerometer; high sensitivity z-axis torsional silicon accelerometer; mechanical gain; minimum resolution; narrow air gaps; nonlinearity; parallel plate sense mechanism; pull-in voltage; readout electronics; three mask dissolved wafer process; torsional suspension beams; varying overlap area method; Accelerometers; Air gaps; Bandwidth; Cutoff frequency; Dynamic range; Dynamic voltage scaling; Fingers; Frequency measurement; Readout electronics; Silicon;
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3393-4
DOI :
10.1109/IEDM.1996.554092