Title :
Metrics evaluation of software reliability growth models
Author :
Chan, Francis C L ; Dasiewicz, Paul P. ; Seviora, Rudolph E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
Numerous software reliability growth models have been proposed. The authors present three metrics which have been helpful in assessing the applicability and predictive validity of these models. These metrics are the relative fitting error metric, the short term predictive validity metric and the long term predictive validity metric. The application of these three metrics is illustrated on estimation of field reliability of telecommunication switching systems
Keywords :
quality control; software metrics; software reliability; switching systems; telecommunications computing; long term predictive validity metric; predictive validity; relative fitting error metric; short term predictive validity metric; software reliability growth models; telecommunication switching systems; Application software; Displays; Inverse problems; Maintenance; Parameter estimation; Predictive models; Software reliability;
Conference_Titel :
Software Reliability Engineering, 1991. Proceedings., 1991 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-2143-5
DOI :
10.1109/ISSRE.1991.145373
