Title :
On some reliability estimation problems in random and partition testing
Author :
Tsoukalas, Markos Z. ; Duran, Joe W. ; Ntafos, Simeon C.
Author_Institution :
Texas Univ., Dallas, TX, USA
Abstract :
Random testing is receiving increasing attention in recent years. Aside from its relative simplicity and low cost, studies have shown that random testing is an effective testing strategy. An advantage of random testing is that the reliability of the program can be estimated from the test outcomes. The authors extend the Thayer-Lipow-Nelson reliability model to account for the cost of errors. They also compare random with partition testing by looking at upper confidence bounds for the cost weighted performance of the two strategies
Keywords :
program testing; software reliability; Thayer-Lipow-Nelson reliability model; cost weighted performance; partition testing; random testing; reliability estimation problems; testing strategy; Computer science; Costs; Design methodology; Documentation; Input variables; Milling machines; Runtime; Software performance; Software testing; Telecommunications;
Conference_Titel :
Software Reliability Engineering, 1991. Proceedings., 1991 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-2143-5
DOI :
10.1109/ISSRE.1991.145380