Title : 
Robust 60 GHz 90nm and 40nm CMOS wideband neutralized amplifiers with 23dB gain 4.6dB NF and 24% PAE
         
        
            Author : 
Cohen, Emanuel ; Degani, Ofir ; Ravid, Shmuel ; Ritter, Dan
         
        
            Author_Institution : 
Mobile Wireless Group, Intel Haifa, Haifa, Israel
         
        
        
        
        
        
            Abstract : 
A three stage transformer differential cross coupled (CC) LNA and PA with integrated baluns for operation in the 57-66GHz band are presented. The LNA fabricated in a 90nm CMOS process achieves 23dB gain and 4.6dB NF at 13mA and 1.3V supply, with 0.06mm2 in size. The PA, also fabricated in a 90nm CMOS process, has maximum power added efficiency (PAE) of 19.4%, 9.4dBm Psat, and 23dB gain with a 12GHz BW and 0.05mm2 chip size. A 2 stage PA fabricated in a digital 40nm CMOS achieves 19dB gain and a record PAE of 24%. The paper analyzes the advantages of MOScap neutralization feedback compared to metal capacitors and low k transformers for process stability and broadband design. Tuning is added to the CC feedback to compensate for process variations.
         
        
            Keywords : 
CMOS integrated circuits; baluns; field effect MIMIC; low noise amplifiers; millimetre wave power amplifiers; CMOS wideband neutralized amplifier; bandwidth 12 GHz; current 13 mA; efficiency 19.4 percent; efficiency 24 percent; frequency 57 GHz to 66 GHz; gain 23 dB; integrated balun; noise figure 4.6 dB; power amplfier; size 40 nm; size 90 nm; three stage transformer differential cross coupled LNA; voltage 1.3 V; CMOS integrated circuits; Gain; Impedance matching; Metals; Noise measurement; Stability analysis; Tuning;
         
        
        
        
            Conference_Titel : 
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on
         
        
            Conference_Location : 
Santa Clara, CA
         
        
            Print_ISBN : 
978-1-4577-1317-0
         
        
        
            DOI : 
10.1109/SiRF.2012.6160151