High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy

Author

Monti, Tamara ; Donato, Andrea Di ; Farina, Marco

Author_Institution

Inf. Eng. Dept. (DII), Univ. Politec. delle Marche, Ancona, Italy

fYear

2012

fDate

16-18 Jan. 2012

Firstpage

109

Lastpage

112

Abstract

In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.

Keywords

frequency-domain analysis; graphene; near-field scanning optical microscopy; scanning tunnelling microscopy; time-domain analysis; STM; conductive glass; few-layer graphene; frequency domain data; high resolution imaging; mechanical exfoliation; nanometric resolution; near-field scanning microwave microscopy; scanning tunneling microscopy; time-domain conversion; wide-band SMM; wide-band near field scanning microwave microscopy; Microscopy; Microwave imaging; Microwave measurements; Microwave theory and techniques; Probes; Reflection; Time domain analysis; Microwave imaging; Microwave measurement; Nanomaterials; Nanotechnology; Scanning probe microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on

Conference_Location

Santa Clara, CA

Print_ISBN

978-1-4577-1317-0

Type

conf

DOI

10.1109/SiRF.2012.6160156

Filename

6160156