Title :
High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy
Author :
Monti, Tamara ; Donato, Andrea Di ; Farina, Marco
Author_Institution :
Inf. Eng. Dept. (DII), Univ. Politec. delle Marche, Ancona, Italy
Abstract :
In this work, we describe the application of an in-house system performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) to a few-layer graphene sample. This sample is produced by mechanical exfoliation of bulk highly oriented graphite and deposited on a substrate of conductive glass. By introducing the time-domain conversion of frequency domain data, we show that it is possible to achieve nanometric resolution.
Keywords :
frequency-domain analysis; graphene; near-field scanning optical microscopy; scanning tunnelling microscopy; time-domain analysis; STM; conductive glass; few-layer graphene; frequency domain data; high resolution imaging; mechanical exfoliation; nanometric resolution; near-field scanning microwave microscopy; scanning tunneling microscopy; time-domain conversion; wide-band SMM; wide-band near field scanning microwave microscopy; Microscopy; Microwave imaging; Microwave measurements; Microwave theory and techniques; Probes; Reflection; Time domain analysis; Microwave imaging; Microwave measurement; Nanomaterials; Nanotechnology; Scanning probe microscopy;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4577-1317-0
DOI :
10.1109/SiRF.2012.6160156
