DocumentCode
342007
Title
Microwave modeling and characterization of thick coplanar waveguides on oxide-coated lithium niobate substrates for electro-optical applications
Author
Ghione, G. ; Goano, M. ; Madonna, G. ; Omegna, C. ; Pirola, M. ; Bosso, S. ; Frassati, D. ; Perasso, A.
Author_Institution
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume
3
fYear
1999
fDate
13-19 June 1999
Firstpage
1007
Abstract
We have experimentally characterized a set of thick coplanar waveguides on Lithium Niobate substrates with and without a SiO/sub 2/-coating layer, having line widths and ground plane spacings in the range 10-80 /spl mu/m. The effective refractive index and attenuation were extracted from raw (uncalibrated) measurements up to 26 GHz through the TRL approach. The characteristic impedance was then obtained from the propagation constant, using an accurate estimate of the in-vacuo capacitance derived from a new conformal mapping approach able to exactly account for large electrode thickness. We observed that the attenuation of lines with or without the oxide buffer layer consistently exhibits a different frequency behaviour, thus suggesting that dielectric losses or metal surface roughness effects can play a significant role in the upper microwave range. Finally, a full analytical model, including losses and frequency dispersion, was derived by extending the quasi-TEM model and shown to yield results in good agreement with measured data.
Keywords
coplanar waveguides; electro-optical modulation; lithium compounds; 26 GHz; LiNbO/sub 3/; SiO/sub 2/; SiO/sub 2/ coating; TRL measurement; capacitance; characteristic impedance; conformal mapping; coplanar waveguide; dielectric loss; electro-optical modulator; frequency dispersion; lithium niobate substrate; metal surface roughness; microwave attenuation; oxide buffer layer; propagation constant; quasi-TEM model; refractive index; Attenuation measurement; Coplanar waveguides; Dielectric loss measurement; Dielectric losses; Frequency; Impedance; Lithium niobate; Planar waveguides; Propagation constant; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.779556
Filename
779556
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