DocumentCode :
342007
Title :
Microwave modeling and characterization of thick coplanar waveguides on oxide-coated lithium niobate substrates for electro-optical applications
Author :
Ghione, G. ; Goano, M. ; Madonna, G. ; Omegna, C. ; Pirola, M. ; Bosso, S. ; Frassati, D. ; Perasso, A.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
3
fYear :
1999
fDate :
13-19 June 1999
Firstpage :
1007
Abstract :
We have experimentally characterized a set of thick coplanar waveguides on Lithium Niobate substrates with and without a SiO/sub 2/-coating layer, having line widths and ground plane spacings in the range 10-80 /spl mu/m. The effective refractive index and attenuation were extracted from raw (uncalibrated) measurements up to 26 GHz through the TRL approach. The characteristic impedance was then obtained from the propagation constant, using an accurate estimate of the in-vacuo capacitance derived from a new conformal mapping approach able to exactly account for large electrode thickness. We observed that the attenuation of lines with or without the oxide buffer layer consistently exhibits a different frequency behaviour, thus suggesting that dielectric losses or metal surface roughness effects can play a significant role in the upper microwave range. Finally, a full analytical model, including losses and frequency dispersion, was derived by extending the quasi-TEM model and shown to yield results in good agreement with measured data.
Keywords :
coplanar waveguides; electro-optical modulation; lithium compounds; 26 GHz; LiNbO/sub 3/; SiO/sub 2/; SiO/sub 2/ coating; TRL measurement; capacitance; characteristic impedance; conformal mapping; coplanar waveguide; dielectric loss; electro-optical modulator; frequency dispersion; lithium niobate substrate; metal surface roughness; microwave attenuation; oxide buffer layer; propagation constant; quasi-TEM model; refractive index; Attenuation measurement; Coplanar waveguides; Dielectric loss measurement; Dielectric losses; Frequency; Impedance; Lithium niobate; Planar waveguides; Propagation constant; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
Type :
conf
DOI :
10.1109/MWSYM.1999.779556
Filename :
779556
Link To Document :
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