• DocumentCode
    3420279
  • Title

    Binding force measurement between micro-scale flat surfaces in aqueous environment by force-sensing piezoresistive micro-cantilevers

  • Author

    Onoe, H. ; Gel, M. ; Hoshino, K. ; Matsumoto, K. ; Shimoyama, I.

  • Author_Institution
    Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ., Japan
  • fYear
    2005
  • fDate
    30 Jan.-3 Feb. 2005
  • Firstpage
    16
  • Lastpage
    19
  • Abstract
    This paper describes binding force measurement using force sensing piezoresistive cantilevers, to evaluate binding between micro scale SiO2 flat surfaces in an HCl solution for fluidic micro-self-assembly. We measured binding force between a cylindrical microparticle and a substrate by pushing the particle with the cantilever. We successfully measured the binding force in nano-newton order caused by van der Waals´ interaction, and revealed that the phenomenon observed in colloid particles occurred similarly in micro scale flat surfaces.
  • Keywords
    force measurement; force sensors; microfluidics; microsensors; piezoresistive devices; self-assembly; van der Waals forces; SiO2; aqueous environment; binding force measurement; colloid particles; cylindrical microparticle; fluidic micro-self-assembly; force-sensing piezoresistive micro-cantilevers; microscale flat surfaces; nano-newton order; van der Waals interaction; Atomic force microscopy; Atomic measurements; Electrical resistance measurement; Fluidic microsystems; Force measurement; Microfluidics; Optical interferometry; Optical microscopy; Particle measurements; Piezoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-8732-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2005.1453856
  • Filename
    1453856