DocumentCode
3420279
Title
Binding force measurement between micro-scale flat surfaces in aqueous environment by force-sensing piezoresistive micro-cantilevers
Author
Onoe, H. ; Gel, M. ; Hoshino, K. ; Matsumoto, K. ; Shimoyama, I.
Author_Institution
Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ., Japan
fYear
2005
fDate
30 Jan.-3 Feb. 2005
Firstpage
16
Lastpage
19
Abstract
This paper describes binding force measurement using force sensing piezoresistive cantilevers, to evaluate binding between micro scale SiO2 flat surfaces in an HCl solution for fluidic micro-self-assembly. We measured binding force between a cylindrical microparticle and a substrate by pushing the particle with the cantilever. We successfully measured the binding force in nano-newton order caused by van der Waals´ interaction, and revealed that the phenomenon observed in colloid particles occurred similarly in micro scale flat surfaces.
Keywords
force measurement; force sensors; microfluidics; microsensors; piezoresistive devices; self-assembly; van der Waals forces; SiO2; aqueous environment; binding force measurement; colloid particles; cylindrical microparticle; fluidic micro-self-assembly; force-sensing piezoresistive micro-cantilevers; microscale flat surfaces; nano-newton order; van der Waals interaction; Atomic force microscopy; Atomic measurements; Electrical resistance measurement; Fluidic microsystems; Force measurement; Microfluidics; Optical interferometry; Optical microscopy; Particle measurements; Piezoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
ISSN
1084-6999
Print_ISBN
0-7803-8732-5
Type
conf
DOI
10.1109/MEMSYS.2005.1453856
Filename
1453856
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