DocumentCode :
3420279
Title :
Binding force measurement between micro-scale flat surfaces in aqueous environment by force-sensing piezoresistive micro-cantilevers
Author :
Onoe, H. ; Gel, M. ; Hoshino, K. ; Matsumoto, K. ; Shimoyama, I.
Author_Institution :
Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ., Japan
fYear :
2005
fDate :
30 Jan.-3 Feb. 2005
Firstpage :
16
Lastpage :
19
Abstract :
This paper describes binding force measurement using force sensing piezoresistive cantilevers, to evaluate binding between micro scale SiO2 flat surfaces in an HCl solution for fluidic micro-self-assembly. We measured binding force between a cylindrical microparticle and a substrate by pushing the particle with the cantilever. We successfully measured the binding force in nano-newton order caused by van der Waals´ interaction, and revealed that the phenomenon observed in colloid particles occurred similarly in micro scale flat surfaces.
Keywords :
force measurement; force sensors; microfluidics; microsensors; piezoresistive devices; self-assembly; van der Waals forces; SiO2; aqueous environment; binding force measurement; colloid particles; cylindrical microparticle; fluidic micro-self-assembly; force-sensing piezoresistive micro-cantilevers; microscale flat surfaces; nano-newton order; van der Waals interaction; Atomic force microscopy; Atomic measurements; Electrical resistance measurement; Fluidic microsystems; Force measurement; Microfluidics; Optical interferometry; Optical microscopy; Particle measurements; Piezoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
ISSN :
1084-6999
Print_ISBN :
0-7803-8732-5
Type :
conf
DOI :
10.1109/MEMSYS.2005.1453856
Filename :
1453856
Link To Document :
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