Accurate full wave analysis of open hemispherical resonators loaded with dielectric layers

Author

Cwikla, A. ; Mielewski, J. ; Mrozowski, M. ; Wosik, J.

Author_Institution

Fac. of Electron. Telecommun. & Inf., Tech. Univ. Gdansk, Poland

Volume

3

fYear

1999

fDate

13-19 June 1999

Firstpage

1265

Abstract

Rotationally symmetric inhomogeneously loaded open resonators are analyzed using the finite difference frequency domain method. State of the art or entirely new techniques are proposed to achieve high accuracy of numerical computations. These include conformal modeling of boundaries and dielectric interfaces, application of the Arnoldi method combined with FIR digital filters, and numerical dispersion correction. As a result the final solution error is as low as 0.013%.

Keywords

cavity resonators; dielectric-loaded waveguides; dispersion (wave); finite difference methods; frequency-domain analysis; Arnoldi method; conformal modeling; dielectric interfaces; dielectric layer loading; finite difference frequency domain method; full wave analysis; numerical computations; numerical dispersion correction; open hemispherical resonators; rotationally symmetric inhomogeneously loaded resonators; solution error; Dielectrics; Digital filters; Eigenvalues and eigenfunctions; Finite difference methods; Finite impulse response filter; Frequency; Mirrors; Numerical models; Polynomials; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1999 IEEE MTT-S International

Conference_Location

Anaheim, CA, USA

Print_ISBN

0-7803-5135-5

Type

conf

DOI

10.1109/MWSYM.1999.779617

Filename

779617