• DocumentCode
    3420521
  • Title

    A Novel Approach to Find the Best Fit for VLSI Partitioning - Physical Design

  • Author

    Shanavas, I. Hameem ; Gnanamurthy, R.K. ; Thangaraj, T. Stephen

  • Author_Institution
    Vels Srinivasa Coll. of Eng. & Technol., Chennai, India
  • fYear
    2010
  • fDate
    16-17 Oct. 2010
  • Firstpage
    330
  • Lastpage
    332
  • Abstract
    Circuit partitioning plays an important role in physical design automation of very large scale integration (VLSI) chips. The interest in finding an optimal partitioning especially in VLSI has been a hot issue in recent years. In VLSI circuit partitioning, the problem of obtaining a minimum cut is of prime importance. To enhance, other criterion like power, delay and area in addition to minimum cut is included. Memetic Algorithm (MA) is an evolutionary algorithm that includes one or more local search phases within its evolutionary cycle. MA applies some sort of local search for optimization of VLSI partitioning. The algorithm combines a hierarchical design technique, Genetic algorithm and constructive techniques like Simulated Annealing for local search to solve VLSI partitioning problem. MA quickly produces optimal solution for the entire popular benchmark problem. The result will be compared with the previous work result.
  • Keywords
    VLSI; genetic algorithms; integrated circuit design; search problems; simulated annealing; VLSI circuit partitioning; evolutionary algorithm; genetic algorithm; local search phases; memetic algorithm; physical design automation; simulated annealing; very large scale integration chips; Algorithm design and analysis; Computational modeling; Delay; Memetics; Optimization; Partitioning algorithms; Very large scale integration; genetic; memetic algorithm; partition problem;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Recent Technologies in Communication and Computing (ARTCom), 2010 International Conference on
  • Conference_Location
    Kottayam
  • Print_ISBN
    978-1-4244-8093-7
  • Electronic_ISBN
    978-0-7695-4201-0
  • Type

    conf

  • DOI
    10.1109/ARTCom.2010.93
  • Filename
    5656802