DocumentCode :
342056
Title :
Finite element realization of ultra-high quality factor frequency-temperature compensated sapphire-rutile whispering gallery mode resonators
Author :
Tobar, M.E. ; Cros, D. ; Blondy, P. ; Hartnett, J.G. ; Guillon, P.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
Volume :
3
fYear :
1999
fDate :
13-19 June 1999
Firstpage :
1323
Abstract :
To build the highest frequency stable microwave oscillators, high-Q sapphire dielectric resonators must have the temperature coefficient of permittivity annulled. This is achieved by fixing thin slabs of low loss crystalline rutile to the ends of the sapphire cylinder. Rigorous finite element analysis has been applied to this resonator. This has allowed optimization of the structure with respect to designability of the annulment temperature and the amount of spurious modes present.
Keywords :
Q-factor; compensation; dielectric resonator oscillators; finite element analysis; frequency stability; microwave oscillators; sapphire; titanium compounds; Al/sub 2/O/sub 3/-TiO/sub 2/; annulment temperature; designability; dielectric resonators; finite element realization; frequency stable microwave oscillators; frequency-temperature compensation; sapphire-rutile whispering gallery mode resonators; spurious modes; structure optimization; temperature coefficient of permittivity; ultra-high quality factor; Crystallization; Design optimization; Dielectrics; Finite element methods; Frequency; Microwave oscillators; Permittivity; Q factor; Slabs; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
Type :
conf
DOI :
10.1109/MWSYM.1999.779631
Filename :
779631
Link To Document :
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