• DocumentCode
    3420720
  • Title

    Crosstalk noise determination for non-identical lines

  • Author

    Deschacht, D. ; Quere, Y.

  • Author_Institution
    Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier LIRMM, Univ. Montpellier II, Montpellier
  • fYear
    2009
  • fDate
    6-9 April 2009
  • Firstpage
    28
  • Lastpage
    32
  • Abstract
    VLSI circuits signal integrity is an emerging concern in high performance integrated circuits. We proposed once an analytical expression to calculate the noise amplitude of a two coupled-line RLC interconnects network; this expression being derived from an analytical transmission line model based on the modes propagating through it. However, this expression supposed a perfect symmetry between both the two coupled lines. When system is dissymmetrical, crosstalk amplitude cannot be evaluated in function of the propagation modes anymore. In this paper, a relation permitting to calculate the noise amplitude of such systems is exposed when the dissymmetry results from different lines geometries. It is described depending on a lines width dissymmetrical factor, the amplitude determined when the system is completely symmetrical; results showing an excellent agreement with SPICE simulations.
  • Keywords
    VLSI; crosstalk; integrated circuit interconnections; integrated circuit noise; VLSI circuits signal integrity; coupled-line RLC interconnects network; crosstalk amplitude; crosstalk noise determination; noise amplitude; nonidentical lines; transmission line model; Analytical models; Coupling circuits; Crosstalk; Distributed parameter circuits; Geometry; Integrated circuit interconnections; Integrated circuit noise; Noise level; RLC circuits; Very large scale integration; VLSI interconnects; crosstalk; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-4320-8
  • Electronic_ISBN
    978-1-4244-4321-5
  • Type

    conf

  • DOI
    10.1109/DTIS.2009.4938018
  • Filename
    4938018