• DocumentCode
    3420800
  • Title

    A new approach to estimate image blur extent based on wavelet module maximum

  • Author

    Zhang, Faquan ; Wang, Guofu ; Ye, Jingcai ; Liu, Qinghua ; Xiao, Xingda

  • Author_Institution
    Dept. of Inf. & Commun. Eng., Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2010
  • fDate
    22-24 Oct. 2010
  • Firstpage
    193
  • Lastpage
    196
  • Abstract
    An approach to estimate image blur extent based on image edge width and wavelet module maximum was proposed. According to the definition of wavelet module value, three-order spline wavelet was chosen to implement multiscale wavelet edge detection and wavelet edge module values were obtained. To select half of wavelet edge module maximum as threshold to segment blur image and its binary image was obtained. Area and girth of the blur edge of the objects in the blur image were calculated according to pixel statistic principle. Blur edge width of objects in the image was given by area and girth of the transition edge. Image blur extent was determined by blur edge width. Experiment results show that the algorithm is effective and performs better.
  • Keywords
    edge detection; image segmentation; binary image; blur image segmentation; image blur extent estimation; image edge width; multiscale wavelet edge detection; pixel statistic principle; three-order spline wavelet; wavelet edge module maximum; wavelet edge module values; wavelet module maximum; Computers; Convolution; Image edge detection; Spline; Blur Edge Width; Image Blur Extent; Image Processing; Threshold Selection; Wavelet Module Maximum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-6834-8
  • Type

    conf

  • DOI
    10.1109/ICISS.2010.5656816
  • Filename
    5656816