Title :
Large-signal characteristics of AlGaN/GaN power MODFETs
Author :
Alekseev, E. ; Pavlidis, D. ; Nguyen, N.X. ; Nguyen, C. ; Grider, D.E.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
This work addresses the scalability of power performance of AlGaN/GaN MODFETs with large gate periphery, as necessary for microwave power devices. High-frequency large-signal characteristics of AlGaN/GaN MODFETs have been studied for devices with gate widths from 0.2 to 1 mm. 1-dB gain compression occurred at input power levels varying from -1 to +10 dBm as the gate width increased, while gain remained almost constant at /spl sim/17 dB. Output power density was maximum (1.3 W/mm) for devices with 0. 6 mm gates and maximum output power (29.9 dBm) occurred in devices with 1 mm gates, while power-added-efficiency remained almost constant at /spl sim/30%.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; microwave field effect transistors; microwave power transistors; power HEMT; semiconductor device measurement; 0.2 to 1 mm; 30 percent; AlGaN-GaN; AlGaN/GaN power MODFETs; high-frequency characteristics; large gate periphery; large-signal characteristics; load-pull measurements; microwave power devices; power performance scalability; power-added-efficiency; Aluminum gallium nitride; Capacitance; Gallium nitride; HEMTs; Laboratories; MODFETs; Power generation; Scalability; Scattering parameters; Transconductance;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.779818