DocumentCode :
3420941
Title :
On fault diagnosis of analog circuits with tolerance using simulated annealing optimization algorithm
Author :
Yan, Li ; Xiangying, Weng
Author_Institution :
Northwestern Polytech. Univ., Xi´´an, China
fYear :
1992
fDate :
9-13 Nov 1992
Firstpage :
1472
Abstract :
The authors extend the numerical annealing algorithm framework presented by S. Kirkpatrick et al. to the case of continuous multidimensional parameter space. The design an efficient parameter inverse simulated annealing (PI-SA) algorithm, and obtain some important theoretical results on continuous annealing algorithm design. They apply the PI-SA optimization algorithm to fault diagnosis of analog circuits with tolerance. A software package for automatic diagnosis has been developed and applied to fault isolation of the electronic equipment of the remotely piloted vehicles. The diagnosis results obtained with the software package both ground simulation and in flight testing are satisfactory
Keywords :
aerospace testing; analogue circuits; automatic testing; fault location; integrated circuit testing; simulated annealing; aerospace testing; analog circuits; automatic testing; continuous multidimensional parameter space; design; fault diagnosis; fault isolation; fault location; ground simulation; in flight testing; optimization algorithm; parameter inverse; simulated annealing; software package; tolerance; Algorithm design and analysis; Analog circuits; Circuit faults; Circuit simulation; Electronic equipment; Fault diagnosis; Inverse problems; Multidimensional systems; Simulated annealing; Software packages;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0582-5
Type :
conf
DOI :
10.1109/IECON.1992.254384
Filename :
254384
Link To Document :
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