Title :
Dynamic compact model of Spin-Transfer Torque based Magnetic Tunnel Junction (MTJ)
Author :
Faber, Louis-Barthélemy ; Zhao, Weisheng ; Klein, Jacques-Oliver ; Devolder, Thibaut ; Chappert, Claude
Author_Institution :
IEF, CNRS, Orsay
Abstract :
The integration of magnetic tunnel junctions (MTJ) above CMOS circuits in embedded magnetic RAM (MRAM) or magnetic FPGA (MFPGA) could bring to digital circuits major advantages associated to non-volatile capability such as instant on/off, multi-context FPGA and zero standby power consumption. A complete simulation model for the hybrid MTJ/CMOS design is presented in this paper. Based on the recently demonstrated spin-transfer torque (STT) writing approach which promises to lower the switching current down to ~120 uA, we have added to the previous static model the dynamic behaviors as well as the switching probability and the thermal effects. The model has been developed in Verilog-A language and implemented on Cadence Virtuoso platform. Many experimental parameters are included in this model to improve the simulation accuracy. Simulations demonstrate that the model can be efficiently used to design hybrid MTJ/CMOS circuits.
Keywords :
CMOS logic circuits; MRAM devices; field programmable gate arrays; hardware description languages; magnetic tunnelling; CMOS circuits; MTJ/CMOS design; Verilog-A language; dynamic compact model; embedded magnetic RAM; magnetic FPGA; magnetic tunnel junction; spin-transfer torque; switching current; zero standby power consumption; CMOS digital integrated circuits; Circuit simulation; Digital circuits; Energy consumption; Field programmable gate arrays; Magnetic circuits; Magnetic tunneling; Semiconductor device modeling; Torque; Writing; MRAM; MTJ; STT; dynamic and static behavoirs; high speed; low power; thermal effects;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-4320-8
Electronic_ISBN :
978-1-4244-4321-5
DOI :
10.1109/DTIS.2009.4938040