Title :
Characterization of acoustic vibration modes at GHz frequencies in bulk acoustic wave resonators by combination of scanning laser interferometry and scanning acoustic force microscopy
Author :
Liu, X. ; Paulo, A. San ; Park, M. ; Bokor, J.
fDate :
30 Jan.-3 Feb. 2005
Abstract :
The application of scanning laser interferometry (SLI) and scanning acoustic force microscopy (SAFM) for the characterization of acoustic vibrations at GHz frequencies in RF resonators is combined and discussed in this work. As a model example, the characterization of a film bulk acoustic resonator (FBAR), including vibration amplitude mapping, decomposition of vibration images into acoustic modes, mode shape reconstruction, dynamic visualization of acoustic vibrations and measurement of dispersion curves, is accomplished by the combination of both techniques.
Keywords :
acoustic resonators; atomic force microscopy; bulk acoustic wave devices; light interferometry; micromechanical resonators; vibrations; GHz frequencies; RF resonators; acoustic vibration modes; bulk acoustic wave resonators; dispersion curve measurement; dynamic visualization; film bulk acoustic resonator; mode shape reconstruction; scanning acoustic force microscopy; scanning laser interferometry; vibration amplitude mapping; vibration image decomposition; Acoustic applications; Acoustic waves; Film bulk acoustic resonators; Frequency; Interferometry; Laser applications; Laser modes; Microscopy; Shape measurement; Vibration measurement;
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
Print_ISBN :
0-7803-8732-5
DOI :
10.1109/MEMSYS.2005.1453895