Abstract :
The following topics are dealt with: CMOS devices; materials; simulation and modeling; factory issues; magnetic recording heads; RF ESD design and technology; and transmission line pulsing and standardization.
Keywords :
CMOS integrated circuits; electrostatic discharge; magnetic recording; CMOS devices; RF ESD design; RF ESD technology; electrostatic discharge; factory issues; magnetic recording heads; materials; modeling; simulation; transmission line pulsing; transmission line standardization;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
