DocumentCode :
3421266
Title :
Precisely controlling the duration of fault injection campaigns: a Statistical view
Author :
Leveugle, R. ; Calvez, A. ; Vanhauwaert, P. ; Maistri, P.
Author_Institution :
TIMA Lab., UJF, Grenoble
fYear :
2009
fDate :
6-9 April 2009
Firstpage :
149
Lastpage :
154
Abstract :
Fault injection has become the main approach to evaluate the dependability of a circuit with respect to soft errors. It can be applied early during the design process and refined along all design steps. However, the main limitation is the huge number of faults that should be injected when large circuits and/or complex workloads and complex error models are considered. This usually leads to practical campaigns based on a randomly selected subset of all potential faults. However, results obtained in these conditions are only estimations and the error on the estimation is never quantified in the literature. This paper presents an approach to quantify both the error on the presented results and the confidence on the computed error interval. Conversely, the computation of the required number of faults to inject in order to achieve a given confidence and error interval is also discussed. Experimental results are shown, fully supporting the presented approach.
Keywords :
error analysis; estimation theory; network synthesis; statistical analysis; circuit design; complex error models; estimation error; fault injection; soft errors; statistical view; Acceleration; Circuit analysis; Circuit faults; Circuit simulation; Clocks; Emulation; Hardware; Indium phosphide; Laboratories; Process design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-4320-8
Electronic_ISBN :
978-1-4244-4321-5
Type :
conf
DOI :
10.1109/DTIS.2009.4938045
Filename :
4938045
Link To Document :
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