DocumentCode
3421266
Title
Precisely controlling the duration of fault injection campaigns: a Statistical view
Author
Leveugle, R. ; Calvez, A. ; Vanhauwaert, P. ; Maistri, P.
Author_Institution
TIMA Lab., UJF, Grenoble
fYear
2009
fDate
6-9 April 2009
Firstpage
149
Lastpage
154
Abstract
Fault injection has become the main approach to evaluate the dependability of a circuit with respect to soft errors. It can be applied early during the design process and refined along all design steps. However, the main limitation is the huge number of faults that should be injected when large circuits and/or complex workloads and complex error models are considered. This usually leads to practical campaigns based on a randomly selected subset of all potential faults. However, results obtained in these conditions are only estimations and the error on the estimation is never quantified in the literature. This paper presents an approach to quantify both the error on the presented results and the confidence on the computed error interval. Conversely, the computation of the required number of faults to inject in order to achieve a given confidence and error interval is also discussed. Experimental results are shown, fully supporting the presented approach.
Keywords
error analysis; estimation theory; network synthesis; statistical analysis; circuit design; complex error models; estimation error; fault injection; soft errors; statistical view; Acceleration; Circuit analysis; Circuit faults; Circuit simulation; Clocks; Emulation; Hardware; Indium phosphide; Laboratories; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-4244-4320-8
Electronic_ISBN
978-1-4244-4321-5
Type
conf
DOI
10.1109/DTIS.2009.4938045
Filename
4938045
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