Title :
Session 5.B: Fault analysis and testability
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscal Era, 2009. DTIS '09. 4th International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-4320-8
DOI :
10.1109/DTIS.2009.4938059
