DocumentCode :
3421594
Title :
Automatic ocular artifact rejection based on independent component analysis and eyeblink detection
Author :
Delsanto, S. ; Lamberti, F. ; Montrucchio, B.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
fYear :
2003
fDate :
20-22 March 2003
Firstpage :
309
Lastpage :
312
Abstract :
The presence of different kinds of artifacts has long been a problem in the analysis and interpretation of electroencephalographic recordings. Recently blind source separation by Independent Component Analysis (ICA) has been successfully employed for the detection and removal of artifactual components and new methods for the automatic identification of the artifactual components are being proposed. In this paper we focus on the automatic removal of eyeblink components from EEG data. First a model of the topographic maps associated to the ICA eyeblink component and a distance quantifying the resemblance to the model are defined. To further improve the reliability of the system, an eyeblink detector was designed which locates the individual eyeblinks within the component, thus confirming the nature of the activation.
Keywords :
blind source separation; electroencephalography; eye; independent component analysis; medical signal processing; EEG; automatic ocular artifact rejection; blind source separation; eye-activity-related topographies; eyeblink detector; eyeblink waveform model; independent component analysis; reliability; scalp topography; Blind source separation; Brain modeling; Detectors; Electroencephalography; Eyes; Higher order statistics; Independent component analysis; Scalp; Signal processing; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering, 2003. Conference Proceedings. First International IEEE EMBS Conference on
Print_ISBN :
0-7803-7579-3
Type :
conf
DOI :
10.1109/CNE.2003.1196822
Filename :
1196822
Link To Document :
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