DocumentCode
3421795
Title
Segmented SCR for high voltage ESD protection
Author
Zhiwei Liu ; Jin He ; Liou, Juin J. ; Jizhi Liu ; Meng Miao ; Shurong Dong
Author_Institution
Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
fYear
2012
fDate
Oct. 29 2012-Nov. 1 2012
Firstpage
1
Lastpage
4
Abstract
Typical SCR with stripe layout style is modified into segmented one in order to tune the SCR´s holding voltage for the ESD protection in different operation voltage domain. SCRs with different segmented style and ratio were made, and according to TLP test results, the most proper one for high voltage ESD protection is selected among them. By delicate layout design and choosing the right segmentation pattern and ratio, the holding voltage of the SCR is obviously lifted to a high level of over 30 V, a high enough value to obtain latch-up immunity.
Keywords
electrostatic discharge; thyristors; SCR holding voltage; TLP test; delicate layout design; high voltage ESD protection; latch-up immunity; segmentation pattern; Anodes; Cathodes; Educational institutions; Electrostatic discharges; Thyristors; Topology; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4673-2474-8
Type
conf
DOI
10.1109/ICSICT.2012.6467917
Filename
6467917
Link To Document