Title :
Segmented SCR for high voltage ESD protection
Author :
Zhiwei Liu ; Jin He ; Liou, Juin J. ; Jizhi Liu ; Meng Miao ; Shurong Dong
Author_Institution :
Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
Typical SCR with stripe layout style is modified into segmented one in order to tune the SCR´s holding voltage for the ESD protection in different operation voltage domain. SCRs with different segmented style and ratio were made, and according to TLP test results, the most proper one for high voltage ESD protection is selected among them. By delicate layout design and choosing the right segmentation pattern and ratio, the holding voltage of the SCR is obviously lifted to a high level of over 30 V, a high enough value to obtain latch-up immunity.
Keywords :
electrostatic discharge; thyristors; SCR holding voltage; TLP test; delicate layout design; high voltage ESD protection; latch-up immunity; segmentation pattern; Anodes; Cathodes; Educational institutions; Electrostatic discharges; Thyristors; Topology; Voltage measurement;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467917
