Title : 
A top-down auditory attention model for learning task dependent influences on prominence detection in speech
         
        
            Author : 
Kalinli, Ozlem ; Narayanan, Shrikanth
         
        
            Author_Institution : 
Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA
         
        
        
            fDate : 
March 31 2008-April 4 2008
         
        
        
        
            Abstract : 
A top-down task-dependent model guides attention to likely target locations in cluttered scenes. Here, a novel biologically plausible top-down auditory attention model is presented to model such task-dependent influences on a given task. First, multi-scale features are extracted based on the processing stages in the central auditory system, and converted to low-level auditory "gist" features. These features capture rough information about the overall scene. Then, the top-down model learns the mapping between auditory gist features and the scene categories. The proposed top-down attention model is tested with prominent syllable detection task in speech. When tested on broadcast news-style read speech using the BU Radio News Corpus, the model achieves 85.8% prominence detection accuracy at syllable level. The results compare well to the reported human performance on this task.
         
        
            Keywords : 
hearing; speech processing; auditory gist feature; central auditory system; cluttered scene; multi-scale feature extraction; prominence detection accuracy; speech detection; syllable detection task; task dependent influence learning; top-down auditory attention model; top-down task-dependent model; Auditory system; Biological system modeling; Brain modeling; Context modeling; Feature extraction; Humans; Laboratories; Layout; Speech analysis; Testing; accent; auditory attention; auditory gist; prominence detection; stress detection;
         
        
        
        
            Conference_Titel : 
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
         
        
            Conference_Location : 
Las Vegas, NV
         
        
        
            Print_ISBN : 
978-1-4244-1483-3
         
        
            Electronic_ISBN : 
1520-6149
         
        
        
            DOI : 
10.1109/ICASSP.2008.4518526