Title :
Parametrically amplified resonant sensor with pseudo-cooling effect
Author :
Wakamatsu, Hirotaka ; Ono, Takuhito ; Esashi, Masqoshi
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
fDate :
30 Jan.-3 Feb. 2005
Abstract :
In this paper, a resonating infrared (IR) sensor with the capability of deamplifying thermal noises based on mechanical parametric amplification is reported. A single-crystalline silicon resonator is formed at the edge of an IR absorber that is freely suspended by narrow beams, and the resonant frequency of the resonator is changed by both heat conduction and thermal stress in irradiating IR radiation. An electrode for electrostatically vibrating near the resonant frequency is integrated, and two electrodes for electrostatically exciting parametric amplification are also formed nearby the resonator. We propose a scheme in which the frequency fluctuation of the mechanical vibration can be reduced by noise-squeezing involved in parametric amplification under an appropriate condition, resulting in improving the noise equivalent power (NEP) and normalized detectivity (D*). In this research, the prototype of thermal resonant IR sensors is fabricated in order to verify the scheme of the noise-squeezing, and parametric resonance with the noise-squeezing in the resonator is conformed and fundamental characteristics of the prototype is reported.
Keywords :
electrodes; heat conduction; infrared detectors; micromechanical resonators; microsensors; noise; parametric devices; radiation effects; vibrations; IR absorber; IR radiation; electrostatic vibration; electrostatically exciting parametric amplification; frequency fluctuation; heat conduction; mechanical parametric amplification; mechanical vibration; noise equivalent power; noise squeezing; normalized detectivity; parametric resonance; parametrically amplified resonant sensor; pseudo-cooling effect; resonant frequency; resonating infrared sensor; single-crystalline silicon resonator; thermal noise deamplification; thermal resonant IR sensors; thermal stress; Electrodes; Infrared sensors; Mechanical sensors; Noise reduction; Prototypes; Resonance; Resonant frequency; Silicon; Thermal sensors; Thermal stresses;
Conference_Titel :
Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on
Print_ISBN :
0-7803-8732-5
DOI :
10.1109/MEMSYS.2005.1453937