Title :
A GIS-like training algorithm for log-linear models with hidden variables
Author :
Heigold, Georg ; Deselaers, Thomas ; Schlüter, Ralf ; Ney, Hermann
Author_Institution :
Dept. of Comput. Sci., RWTH Aachen Univ., Aachen
fDate :
March 31 2008-April 4 2008
Abstract :
Conditional random fields (CRFs) are often estimated using an entropy based criterion in combination with generalized iterative scaling (GIS). GIS offers, upon others, the immediate advantages that it is locally convergent, completely parameter free, and guarantees an improvement of the criterion in each step. GIS, however, is limited in two aspects. GIS cannot be applied when the model incorporates hidden variables, and it can only be applied to optimize the maximum mutual information criterion (MMI). Here, we extend the GIS algorithm to resolve these two limitations. The new approach allows for training log-linear models with hidden variables and optimizes discriminative training criteria different from maximum mutual information (MMI), including minimum phone error (MPE). The proposed GIS-like method shares the above-mentioned theoretical properties of GIS. The framework is tested for optical character recognition on the USPS task, and for speech recognition on the Sietill task for continuous digit string recognition.
Keywords :
character recognition; speech recognition; GIS-like training algorithm; conditional random fields; continuous digit string recognition; discriminative training criteria; entropy based criterion; generalized iterative scaling; log-linear models; maxmimum mutual information criterion; minimum phone error; optical character recognition; speech recognition; Character recognition; Computer science; Entropy; Geographic Information Systems; Mutual information; Optical character recognition software; Parameter estimation; Pattern recognition; Speech recognition; Testing; GIS; maximum entropy; optical character recognition; parameter estimation; speech recognition;
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2008.4518542