DocumentCode :
3422413
Title :
Confidence estimation, OOV detection and language ID using phone-to-word transduction and phone-level alignments
Author :
White, Christopher ; Zweig, Geoffrey ; Burget, Lukas ; Schwarz, Petr ; Hermansky, Hynek
Author_Institution :
HLT Center of Excellence, JHU, Baltimore, MD
fYear :
2008
fDate :
March 31 2008-April 4 2008
Firstpage :
4085
Lastpage :
4088
Abstract :
Automatic speech recognition (ASR) systems continue to make errors during search when handling various phenomena including noise, pronunciation variation, and out of vocabulary (OOV) words. Predicting the probability that a word is incorrect can prevent the error from propagating and perhaps allow the system to recover. This paper addresses the problem of detecting errors and OOVs for read Wall Street Journal speech when the word error rate (WER) is very low. It augments a traditional confidence estimate by introducing two novel methods: phone-level comparison using multi-string alignment (MSA) and word-level comparison using phone-to-word transduction. We show that features from phone and word string comparisons can be added to a standard maximum entropy framework thereby substantially improving performance in detecting both errors and OOVs. Additionally we show an extension to detecting English and accented English for the language identification (LID) task.
Keywords :
maximum entropy methods; natural language processing; speech recognition; Wall Street Journal speech; automatic speech recognition; confidence estimation; language identification; multistring alignment; out of vocabulary detection; out of vocabulary words; phone-level alignments; phone-to-word transduction; word error rate; word-level comparison; Acoustic testing; Acoustic transducers; Automatic speech recognition; Context modeling; Decoding; Dictionaries; Entropy; Lattices; Probability; Vocabulary; Maximum Entropy Methods; Speech Processing; Speech Recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1520-6149
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2008.4518552
Filename :
4518552
Link To Document :
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