• DocumentCode
    3422635
  • Title

    Computer vision for electronics manufacturing

  • Author

    Narasimhan, M.A.

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    1992
  • fDate
    9-13 Nov 1992
  • Firstpage
    1030
  • Abstract
    The author addresses the need for use of vision systems in the electronic industry with certain specific examples of systems that were developed at Texas Instruments. The requirements for precise location and inspection of components are increasing continuously in the semiconductor industry due to smaller pattern geometries and decreasing lead to lead spacing, which in turn mandates the use of computerized vision systems to replace manual tasks. The modular advanced vision system (MAVS) processor was developed by Texas Instruments in the late 1980´s for internal vision applications. The individual modules are described. Vision applications in wafer fabrication, IC assembly and board assembly are discussed. Commonly used vision algorithms and the performance requirements for vision systems are considered
  • Keywords
    computer vision; electronics industry; image processing; integrated circuit manufacture; manufacturing computer control; IC assembly; Texas Instruments; algorithms; board assembly; computer vision; electronic industry; electronics manufacturing; image processing; inspection; lead to lead spacing; location; modular advanced vision system; pattern geometries; performance; semiconductor industry; wafer fabrication; Application software; Assembly; Computer aided manufacturing; Computer vision; Electronics industry; Inspection; Instruments; Lead compounds; Machine vision; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, Instrumentation, and Automation, 1992. Power Electronics and Motion Control., Proceedings of the 1992 International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0582-5
  • Type

    conf

  • DOI
    10.1109/IECON.1992.254470
  • Filename
    254470