DocumentCode
3422785
Title
Influence of the microstructure on the stress state of solder joints during thermal cycling
Author
Menk, Alexander ; Bordas, Stéphane
Author_Institution
Robert Bosch GmbH, Stuttgart
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
5
Abstract
The lifetime of a solder joint is mainly determined by its creep behaviour. Creep arises from the stresses inside the solder joints as a consequence of the thermomechanical mismatch of the board and the substrate. The stress state is heavily influenced by the anisotropy of tin. To understand the damage process in solder joints, the influence of the anisotropic microstructure must be understood. In this paper the influence of different grain sizes, shapes and orientations on the stress state is evaluated, based on numerical experiments.
Keywords
creep; grain size; solders; thermomechanical treatment; anisotropic microstructure; creep behaviour; grain sizes; solder joints; stress state; thermal cycling; thermomechanical mismatch; Anisotropic magnetoresistance; Capacitive sensors; Creep; Fatigue; Lead; Microstructure; Soldering; Thermal stresses; Thermomechanical processes; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938405
Filename
4938405
Link To Document