• DocumentCode
    3422785
  • Title

    Influence of the microstructure on the stress state of solder joints during thermal cycling

  • Author

    Menk, Alexander ; Bordas, Stéphane

  • Author_Institution
    Robert Bosch GmbH, Stuttgart
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The lifetime of a solder joint is mainly determined by its creep behaviour. Creep arises from the stresses inside the solder joints as a consequence of the thermomechanical mismatch of the board and the substrate. The stress state is heavily influenced by the anisotropy of tin. To understand the damage process in solder joints, the influence of the anisotropic microstructure must be understood. In this paper the influence of different grain sizes, shapes and orientations on the stress state is evaluated, based on numerical experiments.
  • Keywords
    creep; grain size; solders; thermomechanical treatment; anisotropic microstructure; creep behaviour; grain sizes; solder joints; stress state; thermal cycling; thermomechanical mismatch; Anisotropic magnetoresistance; Capacitive sensors; Creep; Fatigue; Lead; Microstructure; Soldering; Thermal stresses; Thermomechanical processes; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938405
  • Filename
    4938405