Title :
Microstrip coupling algorithm validation and modification based on measurements and numerical modeling
Author :
Zeeff, Theodore ; Olsen, Chris E. ; Hubing, Todd H. ; Drewniak, James ; DuBroff, Dick
Author_Institution :
Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
In this study, mutual capacitance and inductance between two coupled traces is measured and computed to validate and simplify coupling algorithms used in an expert system software package. The algorithm´s applicability to common microstrip configurations is tested through comparisons between FEM based solutions, S21 measurements and the algorithm solutions under several permutations of a test board. Adjustments to the original algorithm are proposed that reduce computation times with out significantly affecting the accuracy of the result
Keywords :
capacitance; electrical engineering computing; electromagnetic coupling; electromagnetic interference; expert systems; inductance; mesh generation; microstrip lines; software packages; waveguide theory; FEM based solutions; S21 measurements; computation times; coupled traces; expert system software package; inductance; microstrip configurations; microstrip coupling algorithm; modification; mutual capacitance; test board; validation; Capacitance measurement; Circuit testing; Coupling circuits; Electric variables measurement; Electromagnetic measurements; Equations; Inductance measurement; Microstrip; Mutual coupling; Numerical models;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812921