DocumentCode :
3423375
Title :
Variability mechanism centric process family architectures
Author :
Schnieders, Arnd
Author_Institution :
Hasso-Plattner-Inst. for IT Syst. Eng., Potsdam Univ.
fYear :
2006
fDate :
27-30 March 2006
Lastpage :
298
Abstract :
In this paper we describe a variability mechanism centric approach for the representation of process family architectures, which act as the major blueprint for the implementation of families of process oriented software in process family engineering. We therefore analyze the role of variability mechanisms in process family architectures and define a set of variability mechanisms for process family architectures represented as a UML activity diagram. The variability mechanism centric approach for process family architecture modeling allows for representing explicitly and intuitively the variability in a process family architecture and supports the effective reuse of process family architecture parts for the process family members. Moreover, it allows to model the implementation of variability in the process family and thus to take into account the influence of the variability implementation on the non-functional properties of the process family during process family architecture design. Our approach thus supports a more model-driven variability implementation in process family engineering
Keywords :
Unified Modeling Language; software architecture; UML activity diagram; Unified Modeling Language; model-driven variability implementation; process family architecture design; process family architecture modeling; process family engineering; process oriented software; variability mechanism centric process; Automotive engineering; Computer architecture; Consumer electronics; Enterprise resource planning; Power engineering and energy; Process design; Software systems; Systems engineering and theory; Technological innovation; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering of Computer Based Systems, 2006. ECBS 2006. 13th Annual IEEE International Symposium and Workshop on
Conference_Location :
Potsdam
Print_ISBN :
0-7695-2546-6
Type :
conf
DOI :
10.1109/ECBS.2006.72
Filename :
1607378
Link To Document :
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