Title : 
Prediction of the thermo-mechanical material behavior of PEN foil during photolithographic processing
         
        
            Author : 
Barink, M. ; Goorhuis, M. ; Giesen, P. ; Furthner, F. ; Yakimets, I.
         
        
            Author_Institution : 
TNO/Holst Centre, Eindhoven
         
        
        
        
        
        
            Abstract : 
Flexible substrates (polymers) for plastic electronic products are far less stable to environmental factors, like heat and moisture, than currently used non-flexible substrates (silicon). This introduces problems during the lithography process of these products. This study presents a thermo-mechanical model of PEN foil; an organic material often used as flexible substrate for plastic electronics. The model is validated with experimental foil behavior during a loading experiment and with the experimental bending behavior in a foil-on-carrier situation. These kind of models are useful as they can be used to predict and to optimize lithographic process steps.
         
        
            Keywords : 
bending; finite element analysis; photolithography; polymer films; substrates; viscoelasticity; PEN foil; bending behavior; flexible substrates; foil-on-carrier situation; nonflexible substrates; organic material; photolithographic processing; plastic electronic products; polyethylene naphtalate foil; thermo-mechanical material behavior; Capacitive sensors; Consumer electronics; Lithography; Performance evaluation; Plastics; Polymers; Predictive models; Temperature; Testing; Thermomechanical processes;
         
        
        
        
            Conference_Titel : 
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
         
        
            Conference_Location : 
Delft
         
        
            Print_ISBN : 
978-1-4244-4160-0
         
        
            Electronic_ISBN : 
978-1-4244-4161-7
         
        
        
            DOI : 
10.1109/ESIME.2009.4938444