Title :
HPM effects on electronic components and the importance of this knowledge in evaluation of system susceptibility
Author :
Göransson, Gunnar
Author_Institution :
FOA Defence Res. Establishment, Linkoping, Sweden
Abstract :
Electronic components have been investigated considering HPM effects. This includes the nature and types of effects and also how the parameters (power, frequency etc.) of the microwave radiation will influence the effects. We also looked at differences in susceptibility between different component types, technologies, manufacturers, different samples of the same type, technology and manufacturing etc. The results show that this knowledge is important for testing and assessing system susceptibility
Keywords :
CMOS logic circuits; analogue integrated circuits; automatic test equipment; electron device testing; integrated circuit measurement; microwave measurement; radiofrequency interference; transistor-transistor logic; CMOS; HPM effects; RFI; TTL; analog circuits; automatic measurement system; component manufacturers; component technologies; component types; digital logic circuits; electronic components; frequency; microwave modulation; microwave power; microwave radiation; shielding; system susceptibility testing; Cables; Circuit testing; Electronic components; Fixtures; Frequency; Manufacturing; Microwave devices; Microwave measurements; Power measurement; System testing;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812964
